Crystals lie at the root of much of todays advanced technology. Near-perfect crystals of silicon and III-V compounds are needed for microprocessors and optoelectronics, magnetic crystals provide some computer memories, and crystals of all kinds are required for scientific studies and new applications.
This journal is the only review journal which provides a repository of articles and references on the growth and characterization of crystals and their applications. As the years go by it is building up into an invaluable source of information on a wide range of topics.
Advances in the techniques of growing and assessing ever more perfect crystals of a wide range of materials lie at the roots of much of todays advanced technology. The literature of crystal growth is expanding faster than almost any comparable field of science. This journal is planned to fill the need for communication and act as a rapid publication medium for review articles and conference reports in order to keep abreast of developments in this field.
Crystal growth and characterization (or assessment) is of vital interest to many scientists in industry and in universities. The journal covers all aspects of crystal growth and characterization including crystals of semiconductors and electronic materials, oxides, synthetic materials, magnetic and optical crystals, organic and biological crystals and metals. Topics in eutectics, thin film and theory of crystal growth are included and also methods of assessing crystal perfection and purity. The wide-ranging interdisciplinary nature of Progress in Crystal Growth and Characterization of Materials means that it is of interest to physicists, chemists, materials scientists, electronic engineers and metallurgists as well as specialists in crystal growth. Emphasis on practical developments and problems ensures its importance for workers in industry.
This journal carries full review articles, state-of-the-art reports, reviews of important new publications and lists of forthcoming meetings in the field of crystal growth and characterization.
Audience
Crystallographers, Solid State Scientists, Materials Scientists.
Commenced publication 1978
Volumes 42-43, 6 issues (2001)
ISSN: 0960-8974
Editor-in-Chief:
J.B. Mullin,
EMC-Hoo Two, 22,
Branksome Towers,
Westminster Road, Poole,
Dorset BH13 6JT, UK |
