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Powder X-ray diffraction
Powder X-ray diffraction data for all compounds were collected
at 293 K on a Bruker D8 Advance diffractometer which employs
ꢁ
a sealed tube Cu X-ray source (l ¼ 1.5406 A) operating at 40 kV
€
and 30 mA, and is equipped with a primary beam Gobel mirror
ꢁ
and Bruker Vantec-1 PSD detector using radial Soller slits and
a secondary beam Ni filter.
Acknowledgements
The University of the Witwatersrand and the Molecular Sciences
Institute are thanked for providing the infrastructure and
financial support to do this work. Dr Manuel Fernandes is
thanked for inspiring discussions and collecting the X-ray data
and Prof. Dave C. Billing for valuable technical assistance.
12 D. G. Billing and A. Lemmerer, CrystEngComm, 2007, 9, 236–
244.
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