Paper
Journal of Materials Chemistry C
The excitation and emission slits were both set at 5.0 nm with a 13 F. L o´ pez Arbeloa, V. Martinez Martiınez, T. Arbeloa and
À1
scanning rate of 1200 nm min . X-ray diffraction intensity data
I. L o´ pez Arbeloa, J. Photochem. Photobiol., C, 2007, 8, 85–108.
were collected on a Rigaku-Oxford Gemini E diffractometer. 14 K. G. Bhattacharyya and S. S. Gupta, Adv. Colloid Interface
Fluorescence images and intensity quantification data were
Sci., 2008, 140, 114–131.
obtained using a Leica TCS SP8 confocal laser scanning micro- 15 N. Miyamoto, R. Kawai, K. Kuroda and M. Ogawa, Appl. Clay
scope (Germany). The quantum yields were recorded on an
Sci., 2000, 16, 161–170.
Edinburgh FLS 980 steady state spectrometer equipped with an 16 Y. Park, G. A. Ayoko and R. L. Frost, J. Colloid Interface Sci.,
integrating sphere.
2011, 354, 292–305.
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7 C.-C. Wang, L.-C. Juang, T.-C. Hsu, C.-K. Lee, J.-F. Lee and
F.-C. Huang, J. Colloid Interface Sci., 2004, 273, 80–86.
8 D. Yaron-Marcovich, Y. Chen, S. Nir and R. Prost, Environ.
Sci. Technol., 2005, 39, 1231–1238.
9 H. P. He, R. L. Frost, T. Bostrom, P. Yuan, L. Duong,
D. Yang, Y. F. Xi and J. T. Kloprogge, Appl. Clay Sci., 2006,
Computational details
Theoretical calculations were carried out using TD-DFT, B3LYP/
3
4,35,42–48
6-31G**, and the Gaussian 09 program package.
Monomers and dimers used to do the ground-state calculations
were obtained from the crystal structures of SPH and FSPH.
Excited-state simulation for SP and FSP was performed in the
gas phase.
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1, 262–271.
0 Q. Zhao and S. E. Burns, Environ. Sci. Technol., 2012, 4,
999–4007.
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2
2
2
3
1 Q. Zhou, R. L. Zhu, S. C. Parker, J. X. Zhu, H. P. He and
M. Molinari, RSC Adv., 2015, 5, 47022–47030.
2 T. V. Shapley, M. Molinari, R. L. Zhu and S. C. Parker,
J. Phys. Chem. C, 2013, 117, 24975–24984.
3 E. J. M. Hensen, T. J. Tambach, A. Bliek and B. Smit,
J. Chem. Phys., 2001, 115, 3322–3329.
4 J. Huang, H. Wang, X. H. Yang, K. Quan, Y. J. Yang, L. Ying,
N. L. Xie, M. Ou and K. M. Wang, Chem. Sci., 2016, 7,
Conflicts of interest
There are no conflicts to declare.
Acknowledgements
This work was supported by the National Basic Research Program
of China (the 973 Program, 2014CB932103), the National Natural
Science Foundation of China (21656001, 21521005, 21575010 and
3829–3835.
2
5 D. L. Fu, J. E. Schmidt, Z. Ristanovi ´c , A. D. Chowdhury,
F. Meirer and B. M. Weckhuysen, Angew. Chem., Int. Ed.,
21701004), and the Innovation and Promotion Project of Beijing
University of Chemical Technology.
2017, 56, 11217–11221.
2
6 K. Han, D. Go, T. Tigges, K. Rahimi, A. J. C. Kuehne and
A. Walther, Angew. Chem., Int. Ed., 2017, 56, 2176–2182.
7 Q. M. Liu, Q. Xia, S. Wang, B. S. Li and B. Z. Tang, J. Mater.
Chem. C, 2018, 6, 4807–4816.
Notes and references
2
1
2
3
J. C. Ma and D. A. Dougherty, Chem. Rev., 1997, 97, 1303–1324.
D. A. Dougherty, Acc. Chem. Res., 2013, 46, 885–893.
A. S. Mahadevi and G. N. Sastry, Chem. Rev., 2013, 113,
28 A. Ummadisingu, L. Steier, J.-Y. Seo, T. Matsui, A. Abate,
W. Tress and M. Gr ¨a tzel, Nature, 2017, 545, 208–212.
29 W. J. Guan, W. J. Zhou, J. Lu and C. Lu, Chem. Soc. Rev.,
2015, 44, 6981–7009.
2100–2138.
4
K. Fujisawa, M. Humbert-Droz, R. Letrun, E. Vauthey,
T. A. Wesolowski, N. Sakai and S. Matile, J. Am. Chem. 30 H. K. Zhang, X. Y. Zheng, N. Xie, Z. K. He, J. K. Liu,
Soc., 2015, 137, 11047–11056.
D. Q. Yang, Y. G. Wang, D. X. Liu, Z. Q. Li and H. R. Li,
J. Mater. Chem. C, 2018, 6, 1944–1950.
N. L. C. Leung, Y. L. Niu, X. H. Huang, K. S. Wong, R. T. K.
Kwok, H. H. Y. Sung, I. D. Williams, A. J. Qin, J. W. Y. Lam
and B. Z. Tang, J. Am. Chem. Soc., 2017, 139, 16264–16272.
5
6
7
A. J. Neel, M. J. Hilton, M. S. Sigman and F. D. Toste, Nature, 31 I. Shulov, R. V. Rodik, Y. Arntz, A. Reisch, V. I. Kalchenko
2017, 543, 637–646.
and A. S. Klymchenko, Angew. Chem., Int. Ed., 2016, 55,
15884–15888.
W.-L. Zhu, X.-J. Tan, C. M. Puah, J.-D. Gu, H.-L. Jiang,
K.-X. Chen, C. E. Felder, I. Silman and J. L. Sussman, 32 T. Owen, Fundamentals of UV–Visible Spectroscopy, A Primer,
J. Phys. Chem. A, 2000, 104, 9573–9580.
Hewlett-Packard Company, B o¨ blingen, Germany, 1996.
L. J. Juszczak and A. S. Eisenberg, J. Am. Chem. Soc., 2017, 33 Q. Peng, H. Yan, X. H. Zhang and Y.-D. Wu, J. Org. Chem.,
39, 8302–8311.
2012, 77, 7487–7496.
S. Yamada, N. Uematsu and K. Yamashita, J. Am. Chem. Soc., 34 G. A. Petersson, A. Bennett, T. G. Tensfeldt, M. A. Al-Laham,
8
9
1
2
007, 129, 12100–12101.
W. A. Shirley and J. Mantzaris, J. Chem. Phys., 1988, 89,
2193–2218.
1
1
1
0 T. Sakamoto, Y. Nishimura, T. Nishimura and T. Kato,
Angew. Chem., Int. Ed., 2011, 50, 5856–5859.
1 L. D. Lu, R. M. Jones, D. McBranch and D. Whitten, Langmuir,
35 M. J. Frisch, G. W. Trucks, H. B. Schlegel, G. E. Scuseria,
M. A. Robb, J. R. Cheeseman, J. A. Montgomery, Jr.,
T. Vreven, K. N. Kudin, J. C. Burant, J. M. Millam,
S. S. Iyengar, J. Tomasi, V. Barone, B. Mennucci, M. Cossi,
G. Scalmani, N. Rega, G. A. Petersson, H. Nakatsuji,
2002, 18, 7706–7713.
2 V. Mart ´ı nez Mart ´ı nez, F. L o´ pez Arbeloa, J. Ba n˜ uelos Prieto
and I. L o´ pez Arbeloa, J. Phys. Chem. B, 2005, 109, 7443–7450.
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