Journal of the Chemical Society. Chemical communications p. 1248 - 1249 (1987)
Update date:2022-08-11
Topics:
Jin, T.
Okuhara, T.
White, J. M.
SiO2 overlayers, prepared by chemical vapour deposition of Si(OEt)4, were identified by ion scattering spectroscopy and Auger electron spectroscopy to be ultra-thin films uniformly coating ZrO2, but this was not the case for TiO2.
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