Stable ceria-based electrolytes for intermediate temperature-solid oxide fuel cells via HAFNIUM OXIDE (cas 12055-23-1) blocking layer

Add time:07/27/2019    Source:sciencedirect.com

The electronic loss of ceria-based electrolytes is caused by the reduction of ceria at low oxygen partial pressure for intermediate temperature-solid oxide fuel cells. To address this issue, a thin HAFNIUM OXIDE (cas 12055-23-1) layer is deposited at the interface between the anode and electrolyte using a magnetron sputtering system, based on the hypothesis that the stability of ceria electrolytes in the anode side can be controlled as a function of the reducibility of the ceria surface. The performance of ceria-based cells (Nd0.1Ce0.9O2-δ; NDC, Sm0.2Ce0.8O2-δ; SDC) is investigated by varying the HfO2 film thickness on the same ceria-based substrate. The range of thickness of the HfO2 film is 121–686 Å for 6–30 min with the deposition rate of 0.38 Å‧S−1. The open-circuit voltages and power densities of NDC- and SDC-based cells are measured at 600–700 °C as a function of HfO2 film thickness. It is clearly observed that open-circuit voltages and the maximum power densities of both cells increase with the increasing of thickness of HfO2 film until a film thickness of 600 Å is reached. This indicates that the HfO2 layer effectively prevents the electron transfer through the electrolytes by the reduction of ceria. Furthermore, the NDC-cell with the HfO2 film shows a stable performance under a constant current density operation of 130 h at 650 °C.

We also recommend Trading Suppliers and Manufacturers of HAFNIUM OXIDE (cas 12055-23-1). Pls Click Website Link as below: cas 12055-23-1 suppliers

Prev:Mechanism insight into rapid photocatalytic disinfection of Salmonella based on vanadate QDs-interspersed g-C3N4 heterostructures
Next:Nanostructured HAFNIUM OXIDE (cas 12055-23-1) Thin films for Sensing Carbon Monoxide: An Experimental Investigation)